Currently, a new version of the EAM Pattern Catalog is compiled. For more details please refer to this page.
The objective of the EAM Pattern Catalog is to complement existing enterprise architecture (EA) management frameworks, which provide a holistic and generic view on the problem of EA management, and to provide additional detail and guidance needed to systematically establish EA management in a step-wise fashion within an enterprise.
The EAM Pattern Catalog identifies the dependencies between
Methodologies, viewpoints and information model fragments are called EAM patterns: They describe possible solutions for recurring problems that can and may have to be adapted to a specific enterprise context.
The EAM Pattern Catalog identifies best practices by focusing on concerns, methodology patterns (M-Patterns), viewpoint patterns (V-Patterns) and information model patterns (I-Patterns), which are considered relevant by experienced practitioners and are also supported by literature. Anti patterns document recurring solutions, which have proven not to work in practice in order to prevent typical mistakes in EA management. These patterns are accompanied by a comprehensive glossary defining the concepts used therin.
The EAM pattern graph shows the dependencies between Concerns, M-Patterns, V-Patterns, and I-Patterns. Its evolution can be seen by clicking the following image.
The EAM Pattern Catalog utilizes a consistent terminology and information organization to simplify the selection, adaption and integration of EAM patterns.
The EAM pattern catalog should help practitioners introducing EA management in a given enterprise and should provide academia a solid and extensive reference documenting current approaches and their rationale.
In a first phase (October 2006 until July 2007), the EAM Pattern Catalog was initialized by the research project Software Cartography at the Chair for Informatics 19 (sebis) based on input from the following sources:
In a second phase (July 2007 until February 2008), the initial EAM Pattern Catalog was evaluated using an online questionnaire to identify methodologies and viewpoints that are considered relevant by practitioners and that are utilized in practice.
The EAM Pattern Catalog tries to find a balance between a green field approach and a completely predefined approach as provided by some EA management frameworks and EA management tools. It avoids a giant integrated information model but utilizes a consistent terminology and a common organization to permit an understanding and comparison of multiple approaches from different sources. Sample viewpoints help readers to grasp essential concepts.
The EAM Pattern Catalog can be used in different ways, e.g. as a starting point for a new EA initiative, as a reference book, to specify requirements on EAM, or for academic research. More....
The EAM pattern catalog has been designed as an iteratively, extensible approach. Therefore, we are looking for people to join the EAM pattern community to maintain and extend the current EAM pattern catalog.
To join the EAM pattern community you can register for this wiki and join the EAM Pattern Community group afterwards. By registering you will get full access to all pages of this Wiki. It is completely free and only to strengthn the community.
Ideas for the future development of the EAM pattern catalog can be found on this page. Interesting visualizations for the future development of the EAM Pattern Catalog can be found here.
Sponsors and Partners
Representatives of the following companies participated in the online questionnaire
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