Guided Research Ömer Uludağ

Motivation

The pattern-based approach to EAM has been developed to address typical problems of existing EAM approaches like too abstract guidelines, lack of appropriate guidance to be used in practice, or monolithic approaches pursuing an all or nothing approach neglecting the specific demands of an enterprise [Buckl et al. 2009]. Since the initial publication of the EAM pattern language in 2007 [Buckl et al. 2007; Ernst 2008; Buckl et al. 2008], the EAM body-of-knowledge has grown significantly. Unfortunately, a considerable part of this knowledge is yet not accessible. This development calls for an evolution of the EAM pattern language in terms of new patterns as well as structural extensions and publication to make it accessible to researchers and practitioners.

Objectives

The goal of this guided research is to describe structural extensions to the EAM pattern language including:

• Stakeholders for Concerns and V-Patterns
• Data Collection Patterns
• Documents, reports and metrics
• References to TOGAF/ArchiMate

By using the extended EAM pattern language structure new EAM patterns should be documented based on a survey among 13 German companies.

Research method

This guided research follows the pattern-based design research (PDR) method [Buckl et al., 2013].

Literature

• BUCKL, S., ERNST, A. M., LANKES, J., SCHNEIDER, K., AND SCHWEDA, C. M. 2007. A pattern based approach for constructing enterprise architecture management information models. Wirtschaftinformatik Proceedings 2007, 65.
• BUCKL, S., ERNST, A. M., MATTHES, F., AND LANKES, J. 2008. Enterprise Architecture Management Pattern Catalog.
• BUCKL, S., ERNST, A. M., MATTHES, F., RAMACHER, R., AND SCHWEDA, C. M. 2009. Using enterprise architecture management patterns to complement TOGAF. In Proceedings of the IEEE Enterprise Distributed Object Computing Conference, 2009. IEEE.
• BUCKL, S., MATTHES, F., SCHNEIDER, A. W., AND SCHWEDA, C. M. 2013. Pattern-based Design Research–An Iterative Research Method Balancing Rigor and Relevance. In Design Science at the Intersection of Physical and Virtual Design, J. Vom Brocke, R. Hekkala, S. Ram, and M. Rossi, Eds. Springer, Berlin, Heidelberg, 73–87.